Development of Electronics and Signal Processing for a Displacement Measuring Interferometer Probe for Freeform Optics
Sam Butler, MS Candidate
Thursday, April 14, 2016
The burgeoning field of freeform optical design is currently limited by metrological techniques for validating manufactured designs. State-of-the-art measurement systems do not provide the flexibility, measurement bandwidth, or low measurement uncertainty required for producing freeform optics of the same quality achievable for spherical and aspheric parts. One promising avenue for reaching high-quality metrology is through the use of optical coordinate measuring machines (OCMM). These are 5-axis probing machines that use non-contact, optics-based probes for surface measurement. This research seeks to develop an optical probe with high measurement bandwidth and low measurement uncertainty in a compact form factor that provides linear and angular measurement of the optical surface under test. The probe uses homodyne interferometry in a Michelson configuration for linear displacement sensing, and a lens in combination with a position-sensitive detector in an autocollimation capacity for angular displacement sensing. Development of electronics and signal processing, as well as preliminary measurement results using a prototype probe, will be discussed.