Steve Gillmer awarded Zeiss Scholarship

Steve Gillmer, MechE PhD student, was awarded the 2015 Carl Zeiss Student Scholarship at the recent American Society for Precision Engineering Annual Meeting. This award includes the ASPE Annual Meeting registration fee, four tutorial fees, travel expenses, and lodging to the Annual Meeting. In addition, the scholarship provides for travel and lodging to Maple Grove, Minnesota to visit Carl Zeiss Industrial Metrology. Steve is the third recipient of the Carl Zeiss Student Scholarship awarded through ASPE.

Photo: Steve with Dr. Marcin Bauza of Carl Zeiss IMT and Dr. Byron Knapp of Professional Instruments and ASPE President being awarded the scholarship at the ASPE Annual Meeting in Austin, TX.

 

Leave a Reply

Your email address will not be published. Required fields are marked *

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.