Zhangtieli [at] gmail [dot] com
Precision Instrumentation, Metrology, Dimensional Metrology
I am currently a visiting scientist in the Precision Instrumentation Group. My interests are in the fields of precision instrumentation, metrology, and dimensional metrology. I received my M.S. and Ph.D degree in Physical Electronics from Tianjin University, China, in 2005 and 2008 respectively. My doctoral research was focused on nonlinear optical frequency conversion with all-solid-state lasers. I joined the Beijing Aerospace Institute for Metrology and Measurement Technology in 2008, and became a senior engineer in 2011. My research is in high-precision dimensional measurement, including a high-precision cylindricity calibration instrument and multi-degree of freedom displacement measurement. My current research at the University of Rochester focuses on the absolute refractive index measurement by interferometry and multi-degree of freedom interferometry.