Publications

label     2016

Corsetti JA, Green WE, Ellis JD, Schmidt GR, Moore DT. Simultaneous interferometric measurement of linear coefficient of thermal expansion and temperature-dependent refractive index coefficient of optical materials. Applied Optics 2016; 55(29):8145-8152 [www]

Wang C, Ellis JD. Data age error compensation for non-constant velocity metrology. IEEE Transactions on Instrumentation
and Measurement 2016; 65(11): 2601-2611 [www]

Yu X, Zhang T, Ellis JD. Absolute air refractive index measurement and tracking based on variable length vacuum cell. Optical Engineering 2016; 55(6):064112 [www]

Yu X, Gillmer SR, Woody SC, Ellis JD. Development of a compact, fi€ber-coupled, six degree-of-freedom measurement system for precision linear stage metrology. Review of Scientific Instruments 2016; 87(6):065109 [www]

Lu C, Troutman JR, Schmitz TL, Ellis JD, TarbuŠtton JA. Application of the continuous wavelet transform in periodic error compensation. Precision Engineering 2016; 44:245–251 [www]


Green WE, CorseŠi JA, Schmidt GR, Moore DT, Ellis JD. Development of a Michelson interferometer capable of measuring the thermal properties of optical materials, In: Proceedings of the 31th ASPE Annual Meeting, 23-28 Oct 2016, Portland, OR USA (accepted)

Browar AEM, Shuste‚ M, Panas RM, Ellis JD, Spadaccini CM. Overview and comparison of spatial light modulator calibration methods , In: Proceedings of the 31th ASPE Annual Meeting, 23-28 Oct 2016, Portland, OR USA (accepted)

Wozniak K, Elkins N, Brooks D, Savage D, DeMagistris M, MacRae S, Hindman HB, Ellis JD, Knox WH, Huxlin KR. Di‚fferential impact of LIRIC and femto-LASIK on keratocyte viability in cat cornea, ARVO 2016, 1-5 May 2016, SeaŠttle, WA USA

label     2015

Yu X, Gillmer SR, Ellis JD. Beam geometry, alignment, and wavefront aberration effects on interferometric differential wavefront sensing. Measurement Science & Technology 2015;  26:125203 [www]

Gandara-Montano GA, Ivansky A, Savage DE, Ellis JD, Knox WH. Femtosecond laser micromachining of freeform gradient index microlenses in hydrogel-based contact lenses. Optical Materials Express 2015; 5(10):242830 [www]

Zhao Y, Schmidt G, Moore DT, Ellis JD. Absolute thickness metrology with sub-micrometer accuracy using a low coherence distance measuring interferometer. Applied Optics 2015; 54(25):7693–7700 [www]

Gillmer SR, Yu X, Wang C, Ellis JD. Robust high dynamic range optical roll sensing. Optics Leˆtters 2015; 40(11):2497–2500 [www]

Wang C, Ellis JD. Dynamic Doppler frequency shift‰ errors: measurement, characterization, and compensation. IEEE Transactions on Instrumentation and Measurement 2015; 64(7):1994–2004  [www]


Ricci MA, Butler SC,Wang C, Ellis JD, 3 axis homodyne displacement measuring interferometer probe for freeform optics, In: Proceedings of the 30th ASPE Annual Meeting, 1-6 Nov 2015, Austin, TX USA

Wang C, Ellis JD, Real-time periodic error correction for heterodyne interferometers using Kalman Filters, In: Proceedings of the 30th ASPE Annual Meeting, 1-6 Nov 2015, Austin, TX USA

Yu X, Gillmer SR, Howard SC, Woody SC, Ellis JD, Compact six degree-of-freedom interferometer for precision linear stage metrology, In: Proceedings of the 30th ASPE Annual Meeting, 1-6 Nov 2015, Austin, TX USA

Lu C, Ellis JD, Schmitz TL, TarbuŠon JA, Improvement of a periodic error compensation algorithm based on the continuous wavelet transform, In: Proceedings of the 30th ASPE Annual Meeting, 1-6 Nov 2015, Austin, TX USA

Gillmer SR, Head ST, ThŒeisen MJ, Brown TG, Ellis JD, Systems-level integration for focused beam scaŠerometry, In: Proceedings of the 30th ASPE Annual Meeting, 1-6 Nov 2015, Austin, TX USA

Butler SC, Ricci MA, Wang C, Wei Q, Ellis JD, Homodyne displacement measuring interferometer probe for optical coordinate measuring machine with tip and tilt sensitivity, SPIE OptiFab 2015, 12-15 Oct 2015, Rochester, NY USA

Burnham-Fay ED, Jacobs-Perkins D, Ellis JD, Interferometric strain measurements with a fi€ber optic probe, In: Proc. SPIE 9576: Applied Advanced Optical Metrology Solutions, 9-13 Aug 2015, San Diego, CA USA

Yu X, Ellis JD, Experimentally investigate the alignment and beam aberration e‚ffects on interferometric diff‚erential wavefront sensing, In: Proceedings of the ASPE Summer Topical Meeting – Precision Interferometric Metrology, 8 – 10 July 2015, Golden, CO USA

Yu X, Zhang T, Ellis JD, Absolute refractive index sensing and tracking based on a variable length vacuum cell, In: Proceedings of the ASPE Summer Topical Meeting – Precision Interferometric Metrology, 8 – 10 July 2015, Golden, CO USA

Butler SC, Ricci MA, Yu X, Ellis JD, OCMM Displacement Measuring Interferometer Probe with 3-DoF Measurement, In: OSA Imaging and Applied Optics Congress – Freeform Optics, 7-11 June 2015, Arlington, VA USA

Browar AEM*, Green WE, Burns SJ, Ellis JD, Charcterization of the optical properties of printoptical lenses, In: Proceedings of ASPE Summer Topical Meeting: Achieving Precision Tolerances in Additive Manufacturing, 26-29 April 2015, Raleigh, NC USA

label     2014

Savage DE, Brooks DR, DeMagistris M, Xu L, MacRae S, Ellis JD, Knox WH, Huxlin KR. First Demonstration of Ocular Refractive Change using Blue-IRIS in Live Cats, Investigative Ophthalmology & Visual Science 2014; 55(7):4603–4612  [www]

Echter MA, Roll CD, Keene AD, Ellis JD. Carrier fringe analysis algorithms for three degree of freedom optical probing, Precision Engineering 2014; 34(4):893–902  [www]

Brooks DR, Brown NS, Savage DE, Wang C, Knox WH, Ellis JD. Precision large field scanning system for high numerical aperture lenses and application to femtosecond micromachining of ophthalmic materials, Review of Scientific Instruments 2014; 85(6): 065107 [www]

Gillmer SR, Smith RCG, Woody SC, Ellis JD. Compact fiber-coupled three degree-of-freedom displacement interferometry for nanopositioning stage calibration, Measurement Science & Technology 2014; 25(7): 075205 [www]

Zhu M, Li Y, Ellis JD. Polarization model for total internal reflection-based retroreflectors, Optical Engineering 2014; 53(6): 064101 [www]


Brooks DR, Brown NS, Savage DE, Knox WH, Ellis JD, Large stroke scanning system for femtosecond micromachining of custom optical structures in ophthalmic materials, In: Proceedings of the 29th ASPE Annual Meeting, 9-14 Nov 2014, Boston, MA USA

Yu X, Gillmer SR,Wang C, Ellis JD. Beam aberration analysis of di‚erential wavefront interferometry, In: Proceedings of the 29th ASPE Annual Meeting, 9-14 Nov 2014, Boston, MA USA

Zhao Y, Schmidt G, Moore DT, Ellis JD. Absolute thickness metrology with high precision using low coherence interferometry, In: Proceedings of the 29th ASPE Annual Meeting, 9-14 Nov 2014, Boston, MA USA

Wang C, Ellis JD. Phase compensation for dynamic Doppler frequency shi‰s, In: Proceedings of the 29th ASPE Annual Meeting, 9-14 Nov 2014, Boston, MA USA

Keene AD, Pullan EE, Ricci MA, Lanphear J, Echeter MA, Ellis JD. Fiber launching device with polarization control and alignment-preserving reconnection, In: Proceedings of the 29th ASPE Annual Meeting, 9-14 Nov 2014, Boston, MA USA

Lu C, Troutman JR, Ellis JD, Schmitz TL, TarbuŠon JA. Periodic error compensation using frequency measurement with continuous wavelet transform, In: Proceedings of the 29th ASPE Annual Meeting, 9-14 Nov 2014, Boston, MA USA

Ellis JD, Echter MA. Non-contact, point-to-point methods for measuring freeform optics, In: Proceedings of Optical Fabrication & Testing, 22–26 Jun 2014, Kohala Coast, HI USA, (Invited)

ThŒeisen MJ, Head ST, Brown TG, Gillmer SR, Ellis JD, Amplitude, phase, and polarization control with a single spatial light modulator, In: Proc. SPIE ŠThree-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 89491X, 01 Feb, 2014 San Francisco, CA USA

Brown TG, Alonso MA, Vella A, ThŒeisen MJ, Head ST, Gillmer SR, Ellis JD Focused beam scaŠerometry for deep subwavelength metrology, In: Proc. SPIE ThŠree-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 89490Y, 01 Feb, 2014 San Francisco, CA USA

label     2013

Lu C, Gillmer SR, Ellis JD, Schmitz TL, Troutman J, Tarbutton JA, Application of wavelet analysis in heterodyne interferometry, In: Proceedings of the 28th ASPE Annual Meeting, 20-25 Oct 2013, St. Paul, MN, USA

Fesperman R, Brown N, Elliot K, Ellis JD, Grabowski A, Ludwick S, Maneuf S, O’Conner B, Woody S, Methods for performance evaluation of single axis positioning systems: a new standard, In: Proceedings of the 28th ASPE Annual Meeting, 20-25 Oct 2013, St. Paul, MN, USA

Fesperman R, O’Conner B, Ellis JD Methods for performance evaluation of single axis positioning systems: dynamic straightness, In: Proceedings of the 28th ASPE Annual Meeting, 20-25 Oct 2013, St. Paul, MN, USA

Ellis JD, Gillmer SR, O’Connor B, Methods for performance evaluation of single axis positioning systems: dynamic angular performance, In: Proceedings of the 28th ASPE Annual Meeting, 20-25 Oct 2013, St. Paul, MN, USA

Ellis JD, Ludwick S, Methods for performance evaluation of single axis positioning systems: move and settle performance, In: Proceedings of the 28th ASPE Annual Meeting, 20-25 Oct 2013, St. Paul, MN, USA

Zhu M, Li Y, Ellis JD, Retroreflector Polarization Model, In: Proceedings of the 28th ASPE Annual Meeting, 20-25 Oct 2013, St. Paul, MN, USA

Brooks DR, Brown NS, Xu L, Savage DE, Knox WH, Ellis JD, Precision high numerical aperture scanning system for femtosecond micromachining of ophthalmic materials over large field, In: Proceedings of the 28th ASPE Annual Meeting, 20-25 Oct 2013, St. Paul, MN, USA

Echter MA, Roll CD, Keene AD, Ellis JD, Three degree-of-freedom optical probe with fiber detection using carrier fringe methods, In: Proceedings of the 28th ASPE Annual Meeting, 20–25 Oct 2013, St. Paul , MN, USA

Gillmer SR, Ellis JD, Design Considerations in a Novel Fiber-Coupled Three Degree-of- Freedom Displacement Interferometer, Proc. SPIE 8836, Optomechanical Engineering 2013, 883604

Briggs D, Echaves S, Pidgeon B, Travis N, Ellis JD, Accurately measuring dynamic coefficient of friction in UltraForm Finishing, Proc. SPIE 8838, Optical Manufacturing and Testing X, 88380U

label     2012

Ellis JD, Baas M, Joo K, Spronck JW. Theoretical analysis of errors in correction algorithms for periodic nonlinearity in displacement measuring interferometers, Precision Engineering 2012; 36(2):261–269 [www]

Ellis JD, Voigt D, Spronck JW, Verlaan AL, Munnig Schmidt RH. Frequency Stabilized HeNe Gas Laser with 3.5 mW from a single mode, Precision Engineering 2012; 36(2):203–209  [www]


Gillmer SR, Smith RGC, Woody SC, Tarbutton J, Ellis JD, Miniature, fiber-coupled 3-DOF interferometer for precision micro-motion stage metrology, In: Proceedings of the 27th ASPE Annual Meeting, 21–26 Oct 2012, San Diego, CA, USA

Smith RGC, Wang C, Ellis JD, Sensitivity of optical fibers to mechanical and thermal perturbations for interferometric applications, In: Proceedings of the 27th ASPE Annual Meeting, 21–26 Oct 2012, San Diego, CA, USA

Burnham-Fay ED, Ellis JD, Precision flexure stage utilizing parasitic motion, In: Proceedings of the 27th ASPE Annual Meeting, 21–26 Oct 2012, San Diego, CA, USA

Katz P, Lynch T, Magill A, Maag-Tanchack, Ellis JD, UFF Belt Characterization, In: Proceedings of Optical Fabrication & Testing, 24–28 Jun 2012, Monterey, CA, USA

Ellis JD, Gillmer SR, Wang C, Smith RGC, Woody SC, Tarbutton J, Fiber-coupled 3-DOF interferometer for EUV lithography stage metrology, In: Proceedings of ASPE Summer Topical Meeting: Precision Engineering and Mechatronics Supporting the Semiconductor Industry, 24–26 Jun 2012, Berkeley, CA, USA

label     2011

Ellis JD, Meskers AJH, Spronck JW, Munnig Schmidt RH. Fiber coupled displacement interferometry without periodic nonlinearity, Optics Letters 2011; 36(18):3584–3586  [www]

Voigt D, Ellis JD, Verlaan AL, Bergmans RH, Spronck JW,Munnig Schmidt RH. Towards interferometry for dimensional drift measurements with nanometer uncertainty, Measurement Science & Technology 2011; 22(9):094029 [www]


Ellis JD, Voigt D, Spronck JW, Verlaan AL, Munnig Schmidt RH. Stabilized HeNe gas laser with greater than 3.5 mW of optical power, In: Proceedings of the 26th ASPE Annual Meeting, 13–18 Nov 2011, Denver, CO, USA

Ellis JD, Meskers AJH, Spronck JW, Munnig Schmidt RH. Towards fiber-coupled displacement measuring interferometers, In: Proceedings of the 26th ASPE Annual Meeting, 13–18 Nov 2011, Denver, CO, USA

Voigt D, Ellis JD, Verlaan A, Spronck JW, Bergmans R, Munnig Schmidt RH. Displacement interferometry for dimensional stability measurements, In: Proceedings of the International Congress of Metrology, 3–6 October 2011, Paris, France

Meskers AJH, Ellis JD, Spronck JW, Munnig Schmidt RH. Displacement interferometry with fiber coupled delivery, In: Proceedings of the 10th IMEKO Symposium, 12–14 Sept 2011, Braunschweig, Germany

Meskers AJH, Ellis JD, Spronck JW, Munnig Schmidt RH. Fiber coupled sub nanometer displacement interferometry without periodic nonlinearity, In: Proceedings of the 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII), 29 Jun – 2 July 2011, KAIST, Daejeon, Korea

Voigt D, Ellis JD, Verlaan A, Spronck JW, Bergmans R, Munnig Schmidt RH. Interferometry for picometer-level dimensional stability measurements , In: Proceedings of CLEO/Europe-EQEC 2011, 21–26 May 2011, Munich, Germany

label     2010

Joo K, Ellis JD, Spronck JW, Munnig Schmidt RH. Real-time wavelength corrected heterodyne laser interferometry, Precision Engineering 2010; 35(1):38–43  [www]

Ellis JD, Joo K, Buice ES, Spronck JW. Frequency stabilized three mode HeNe laser using nonlinear optical phenomena, Optics Express 2010; 18(2):1373–1379 [www]

Joo K, Ellis JD, Buice ES, Spronck JW, Munnig Schmidt RH. High resulution heterodyne interferometer without detectable periodic nonlinearity, Optics Express 2010; 18(2):1159–1165  [www]


Ellis JD, BaasM, Spronck JW. Errors in measurement and compensation algorithms for periodic nonlinearity correction, In: Proceedings of the 25th ASPE Annual Meeting, 31 Oct–5 Nov 2010, Atlanta, GA

Voigt D, Ellis JD, Verlaan A, Spronck JW, Bergmans R, Munnig Schmidt RH. Towards traceable metrology for material stability characterization , In: Proceedings of NanoScale 2010, 27–29 Oct 2010, Brno, Czech Republic

Verlaan A, Ellis JD, Voigt D, Spronck JW, Munnig Schmidt RH. Interferometric system for pm-level stability characterization, In: Proceedings of the ISCO 2010, 4–8 Oct 2010, Rhodes Island, Greece

Joo K, Ellis JD, Buice ES, Spronck JW, Munnig Schmidt RH. A novel heterodyne displacement interferometer with no detectable periodic nonlinearity and optical resolution doubling, In: Proceedings of the 10th euspen International Conference, 31 May – 3 Jun 2010, Delft, The Netherlands

Ellis JD, Joo K, Buice ES, Spronck JW, Munnig Schmidt RH. Frequency stabilization and heterodyne system via the mixed mode in three mode HeNe lasers , In: Proceedings of the 10th euspen International Conference, 31 May – 3 Jun 2010, Delft, The Netherlands

label     2009

Joo K, Ellis JD, Spronck JW, van Kan PJM, Munnig Schmidt RH. A simple heterodyne laser interferometer with sub-nm periodic errors, Optics Letters 2009; 34(3):386–388 [www]

Ellis JD, Joo K, Spronck JW, Munnig Schmidt RH. Balanced interferometric system for stability measurements, Applied Optics 2009; 48(9):1733–1740  [www]

Joo K, Ellis JD, Spronck JW, Munnig Schmidt RH. Design of a folded, multi-pass Fabry-Perot interferometer using a He-Ne laser for displacement metrology (Technical Design Note), Measurement Science & Technology 2009; 20(10):107001  [www]


Ellis JD, Joo K, Buice ES, Spronck JW, Munnig Schmidt RH. Magnetic field effects on the secondary beat frequency profile for three mode HeNe laser stabilization, In: Proceedings of the 24th ASPE Annual Meeting, 4-9 Oct 2009, Monterey, CA

Ellis JD, Joo K, Spronck JW, Munnig Schmidt RH. Double-sided interferometer with low drift for stability testing, In: Proceedings of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII), 29 Jun – 2 July 2009, St. Petersburg, Russia

Joo K, Ellis JD, Spronck JW, van Kan PJM, Munnig Schmidt RH. Simple heterodyne laser interferometer without periodic errors, In: Proceedings of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII), 29 Jun – 2 July 2009, St. Petersburg, Russia

Joo K, Ellis JD, Spronck JW,Munnig Schmidt RH. Wavelength corrected, non-polarizing heterodyne laser interferometry in air, In: Proceedings of the 9th euspen International Conference, 2–5 Jun 2009, San Sebastian, Spain

label     2008


Ellis JD, Smith ST, Hocken RJ. Alignment uncertainties in ideal indentation styli, Precision Engineering 2008; 32(3):207–214 [www]


Ellis JD, Joo K, Verlaan A, Spronck JW, Munnig Schmidt RH. Uncertainty considerations for interferometric stability testing, In: Proceedings of the 23rd ASPE Annual Meeting, 19–23 Oct 2008, Portland, OR

Buice ES, Ellis JD, Langen HH, Munnig Schmidt RH. Importance of metrology in micro-machines, In: Proceedings of the 6th InternationalWorkshop on Microfactories, 14–19 Oct 2008, Chicago, IL

label     2007

Ellis JD, Hatzigeorgopoulos JH, Spronck JW, Munnig Schmidt RH. Optically balanced, multi-pass displacement interferometry for picometer stability testing, In: Proceedings of the 22nd ASPE Annual Meeting, 14–19 Oct 2007, Dallas, TX

Ellis JD, Smith ST, Hocken RJ. Reducing uncertainties in nanoindentation, In: Proceedings of the 7th euspen International Conference, 20–24 May 2007, Bremen, Germany; 2007 1: pp. 274-277

label     2006

Ellis JD, Smith ST, Hocken RJ. An instrument for nanoindentation without frame stiffness dependency, In: Proceedings of the 21st ASPE Annual Meeting, 15–20 Oct 2006, Monterey, CA