Rowan Successfully Completes MS Exit Exam

Congratulations to Jeffrey Rowan who successfully completed his MS exit exam on April 19, 2017.  Jeff, advised by Professor Doyley, presented research work titled "Size isolation of microbubbles using microfluidics chips."  Professor Kevin Parker served on the exam committee.  Jeff's MS degree was conferred on May 20, 2017, and he continues in Prof. Doyley's lab as a PhD candidate.  Again, congratulations to Jeff and many thanks for his contributions to the Parametric Imaging Research Lab.