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Jonathan D. Ellis

  • Assistant Professor, Department of Mechanical Engineering
  • Assistant Professor, The Institute of Optics

PhD, Delft University of Technology, Netherlands, 2010

215 Hopeman Building
(585) 275-4844
Fax: (585) 256-2509


Research Overview

My overall research theme is building novel instruments which enhance metrology capabilities and are used to improve manufacturing processes. I am also interested in system integration for metrology tools onto existing precision systems or designing scratch-built systems for custom applications. My current research projects are in designing and developing smart optical sensors for compact, remote displacement sensing and for multi-DOF interferometry. In addition to those, I am interested in linear displacement interferometry, high power gas laser frequency stabilization, refractometry, flexure systems, stage metrology, precision machine design, and capacitance sensor design.