Home Introduction Sample Preparation Reference

1. Secondary Electron Imaging

   The following images are all micrographs taken using the secondary electron imaging technique (SE2,and inlens detector).
   Because the ice replicas are relatively large, in order to achieve, the depth of field is not optimal. As we can see, the freezer
   ice replica does not possess the same  hexagonal structure as the snowflakes. This confirms our earlier assessment that perfect 
   hexagonal snowflake structure can only be formed with proper temperature and humidity.The last two images are previously 
   collected snowflakes samples which showed dramatic difference with the freezer ice sample.
   
   

2. Backscatter electron imaging.
   
   the following micrographs are taken with backscatter electron imaging technique, however, due to
   there are no high atomic number element present in my sample, we can't really see much with this technique.


3. Electron Fly Simulation.
   
   I used electron fly simulation technique to simulate the electron interaction volume. I used three different accelerating voltage, 5KV, 10KV, and 20KV.


4. Light Microscope and Electron Lithography.
   
   I also made snowflake patterns using E-beam lithography, it's all positive resist with line dose.