© Suju Gurung, University of Rochester, May 2013
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Sample Preparation
LM
SEM
BSE
Colorization
Anaglyphs
Acknowledgements
Secondary Electron Microscopy
Cross sections of fractured surfaces were observed using the SEM/FIB Zeiss-Auriga at around 15-20kV using the SE2 detector.
Fracture in String G:
Fracture images in Strings B and E:
Fracture in Nylon String: