An analysis of hydrophobic fabric using electron microscopy

Sanjay Lakshmanan, Mechanical Engineering, University of Rochester

• Home
• SEM
• EDS
• EFS
• AFM
• Acknowledgements

Electron Flight Simulation (EFS)

Figure 4.1 EFS of an organic material impacted by electrons at an accelerating voltage of 20kV.

Electron Flight Simulator is a good way of visualizing the interaction volume that plays a huge role in secondary electron imaging. It utilizes a Monte Carlo algorithm to perform random scattering events that might occur when electrons collide with the atoms in the sample.