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Introduction
Procedure

SEM

TEM

X-ray

Electron Flight Simulation

AFM

Colorization

Conclusion

Acknowledgments

References

SEM

The nanoparticles were characterized using the SEM (Zeiss Auriga, Gemini column) in the Institute of Optics at the University of Rochester.  The SE2 and InLens detectors gave the best images.  Three different types of samples were imaged at an accelerating voltage of 20kV and a working distance of 5mm.

It appears as though there are some agglomerates of particles, which may be an indication of insufficient washing of the nanoparticles.  The result is surfactant present on the nanoparticles.

B1 SEM
Figure 1: Low concentration Pd-Ag NPs, SE2 detector


A1 SEM
Figure 2: Medium concentration Pd-Ag NPs, SE2 detector


A2 SEM
Figure 3: High concentration Pd-Ag NPs, InLens detector