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Introduction
Procedure

SEM

TEM

X-ray

Electron Flight Simulation

AFM

Colorization

Conclusion

Acknowledgments

References

Electron Flight Simulation

Electron flight simulation was utilized in order to simulate the electron-sample interaction for the Ag-Pd nanoparticles in the SEM.  The accelerating voltage was set at 5, 10, and 20kV which represents the range in which the micrographs and x-ray characterization were done at.  The simulation parameters did not allow the input diameter for the nanoparticle to be less than 500 nm, even though the nanoparticles are much smaller than that.  For an accelerating voltage of 5kV, the interaction volume is shown inside the nanoparticle.  For 10kV the electrons penetrate much deeper into the sample and for 20kV the electrons go through the sample and deep into the substrate.  


EFS 5kv

 EFS 10kv

 EFS 20kv

Figure 22: Medium concentration Ag-Pd NPs, electron flight simulation with accelerating voltages of 5kV, 10kV, and 20kV, respectively.