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Introduction
Procedure
SEM
TEM
X-ray
Electron
Flight Simulation
AFM
Colorization
Conclusion
Acknowledgments
References
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Electron Flight Simulation
Electron
flight simulation was utilized in order to simulate the electron-sample
interaction for the Ag-Pd nanoparticles in the SEM.
The accelerating voltage was set at 5, 10,
and 20kV which represents the range in which the micrographs and x-ray
characterization were done at. The
simulation parameters did not allow the input diameter for the
nanoparticle to
be less than 500 nm, even though the nanoparticles are much smaller
than
that. For an accelerating voltage of
5kV, the interaction volume is shown inside the nanoparticle. For 10kV the electrons penetrate much deeper
into the sample and for 20kV the electrons go through the sample and
deep into
the substrate.



Figure
22: Medium concentration Ag-Pd NPs, electron flight simulation
with accelerating voltages of 5kV, 10kV, and 20kV, respectively.
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