Jonathan D. Ellis
- Associate Professor (Visiting Research) Department of Mechanical Engineering
PhD, Delft University of Technology, Netherlands, 2010
My overall research theme is building novel instruments which enhance metrology capabilities and are used to improve manufacturing processes. I am also interested in system integration for metrology tools onto existing precision systems or designing scratch-built systems for custom applications. My current research projects are in designing and developing smart optical sensors for compact, remote displacement sensing and for multi-DOF interferometry. In addition to those, I am interested in linear displacement interferometry, high power gas laser frequency stabilization, refractometry, flexure systems, stage metrology, precision machine design, and capacitance sensor design.
- Optical Interferometry
- Precision Engineering
- Machine Design